Toronto Star

New ZEISS Crossbeam 750 FIB-SEM for high-accuracy sample preparation workflows

New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live SEM imaging extended to monitor rapid FIB milling down to ultrafine lamella polishing Largest undistorted ...
Nature

Super high-quality SEM/FIB imaging of dentine structures without collagen fiber loss through a metal staining process

Scanning Electron Microscope/Focused Ion Beam (SEM/FIB) system has become valuable and popular tool for the analysis of biological materials such as dentine structures. According to physiological and ...
AZoNano

Using Advanced FIB-SEM Tomography to Characterize Solid Oxide Electrolysis Cells

Solid oxide electrolysis cells (SOEC) show great promise as an alternative to batteries for storing excess renewable energy as they achieve almost 100% electrical-to-H 2 efficiency. In the SOEC, ...
Nature

Patch-Based convolutional neural networks for multiple microstructural features detection in FIB-SEM micrographs of irradiated nuclear fuel

Focused ion beam scanning electron microscopy (FIB-SEM) tomography has increasingly been utilized for acquiring three-dimensional (3D) microstructure features at the sub-micron scale in irradiated ...
Finanznachrichten

Carl Zeiss Microscopy GmbH: New ZEISS Crossbeam 750 FIB-SEM for high-accuracy sample preparation workflows

Advances in simultaneous SEM imaging while FIB milling provide unmatched feedback for precision endpointing New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live ...