As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

Maybe you should try boundary scan testing now that your continuity buzzer has died. Most engineers are familiar with the theory of boundary scan testing, but what about having actual hands-on ...

Large digital integrated circuits are becoming harder to test in a time- and cost-efficient manner. AI chips, in particular, have tiled architectures that are putting pressure on older testing ...

The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

Zetacon Corporation designs and manufactures advanced power-control systems in hardware and software. Our products and technologies range from motor drives to power supplies, digital audio with ...